Ayyagari, S. V. G., Almishal, S. S., Mukherjee, D., Roccapriore, K. M., Maria, J., & Alem, N. (2026). Quantifying the coupling between strain and cation valence in high entropy oxide thin films using electron microscopy.
Citazione stile Chigago Style (17a edizione)Ayyagari, Sai Venkata Gayathri, Saeed SI Almishal, Debangshu Mukherjee, Kevin M. Roccapriore, Jon-Paul Maria, e Nasim Alem. Quantifying the Coupling Between Strain and Cation Valence in High Entropy Oxide Thin Films Using Electron Microscopy. 2026.
Citatione MLA (9a ed.)Ayyagari, Sai Venkata Gayathri, et al. Quantifying the Coupling Between Strain and Cation Valence in High Entropy Oxide Thin Films Using Electron Microscopy. 2026.
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