Cita APA (7a ed.)

Schwarberg, J. H., Magerl, F., Beuer, S., May, A., Gobert, C., Siebert, M., . . . Schulze, J. (2026). Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes.

Cita Chicago Style (17a ed.)

Schwarberg, Jannik H., et al. Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral Pin-Diodes. 2026.

Cita MLA (9a ed.)

Schwarberg, Jannik H., et al. Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral Pin-Diodes. 2026.