APA-Zitierstil (7. Ausg.)

Shalmani, M. A., Boroujeni, A. R., Amini, A., & Yuan, J. S. (2026). From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection.

Chicago-Zitierstil (17. Ausg.)

Shalmani, Mohammad Alijanpour, Alale Rezvani Boroujeni, Ali Amini, und Jiann Shiun Yuan. From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection. 2026.

MLA-Zitierstil (9. Ausg.)

Shalmani, Mohammad Alijanpour, et al. From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection. 2026.