Zou, L. (1999). Application of optical scatterometry to microstructure changes of Si1 xGex/Si heterostructures grown by gas source molecular beam epitaxy. Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C.
Citazione stile Chigago Style (17a edizione)Zou, L.F. Application of Optical Scatterometry to Microstructure Changes of Si1 XGex/Si Heterostructures Grown by Gas Source Molecular Beam Epitaxy. Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C, 1999.
Citatione MLA (9a ed.)Zou, L.F. Application of Optical Scatterometry to Microstructure Changes of Si1 XGex/Si Heterostructures Grown by Gas Source Molecular Beam Epitaxy. Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales A.C, 1999.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.