APA-Zitierstil (7. Ausg.)

Tan, H., Zhang, L., Li, Z., Li, J. T., & Dong, P. (2024). Impact of neutron radiation induced defects on the surge current robustness of silicon carbide P‐intrinsic‐N diodes. Wiley. https://doi.org/10.1002/elt2.64

Chicago-Zitierstil (17. Ausg.)

Tan, Haoshu, Lin Zhang, Zhiqiang Li, Jun Tao Li, und Peng Dong. Impact of Neutron Radiation Induced Defects on the Surge Current Robustness of Silicon Carbide P‐intrinsic‐N Diodes. Wiley, 2024. https://doi.org/10.1002/elt2.64.

MLA-Zitierstil (9. Ausg.)

Tan, Haoshu, et al. Impact of Neutron Radiation Induced Defects on the Surge Current Robustness of Silicon Carbide P‐intrinsic‐N Diodes. Wiley, 2024. https://doi.org/10.1002/elt2.64.