48‐2: Improving the Reliability of High‐Mobility Oxide TFTs through TCAD Simulation of Optimizing Device Structure

Fuente: Wiley Open Access

Saved in:

Bibliographic Details
Main Authors:	Hejing Sun, Xiaoliang Zhou, Shiqiang Ren, Xiaoxing Zhang, Zhiwei Tan, Yangxing Liu
Format:	Artículo Open Access
Published:	Wiley 2025
Subjects:	SID Symposium Digest of Technical Papers
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet