Skip to content
VuFind
  • Login
    • English
    • Deutsch
    • Español
    • Français
    • Italiano
Advanced
  • Cite this
  • Text this
  • Email this
  • Print
  • Export Record
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
  • Save to List
  • Permanent link
Cover Image

Saved in:
Bibliographic Details
Main Authors: Kilian Kirchhoff, Ingo Rotscholl, Bob Liu, Udo Krüger
Format: Artículo Open Access
Published: Wiley 2025
Subjects:
SID Symposium Digest of Technical Papers
Online Access:https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18766
Tags: Add Tag
No Tags, Be the first to tag this record!
  • Holdings
  • Description
  • Table of Contents
  • Comments
  • Similar Items
  • Staff View

Internet

https://sid.onlinelibrary.wiley.com/doi/10.1002/sdtp.18766

Similar Items

  • 27‐2: Invited Paper: Reproducible Characterization of Microdisplays using Imaging Luminance Measurement Devices (ILMDs)
    by: Ingo Rotscholl, et al.
    Published: (2024)
  • 30‐1: Distinguished Paper: Measuring and Characterizing the Diffractive Component in Display Reflection
    by: Ingo Rotscholl, et al.
    Published: (2025)
  • 57‐2: Invited Paper: Reproducible Characterization of Automotive Full Area Local Dimming (FALD) LCDs
    by: Ingo Rotscholl, et al.
    Published: (2024)
  • P‐1.34: Recent Developments in Vertial Amorphous Oxide Semiconductor (AOS) Thin‐Film Transistor (TFT) Devices
    by: Qianqian Bu, et al.
    Published: (2025)
  • P‐4.26: The Development and Prospect of 3D Gaussian Splatting
    by: Yang Hu, et al.
    Published: (2025)

Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • Course Reserves
  • New Items

Need Help?

  • Search Tips
  • Ask a Librarian
  • FAQs