APA (7th ed.) Citation

Lukeš, J., Hájková, V., Hlubučková, M., Kanclíř, V., & Žídek, K. (2025). Sensitive detection of Si3N4 thin-film defects via second harmonic generation microscopy. Zenodo.

Chicago Style (17th ed.) Citation

Lukeš, Jakub, Věra Hájková, Martina Hlubučková, Vít Kanclíř, and Karel Žídek. Sensitive Detection of Si3N4 Thin-film Defects via Second Harmonic Generation Microscopy. Zenodo, 2025.

MLA (9th ed.) Citation

Lukeš, Jakub, et al. Sensitive Detection of Si3N4 Thin-film Defects via Second Harmonic Generation Microscopy. Zenodo, 2025.